Near Field Profilers

Near field profiling can be used with either camera profilers or scanning slit profilers to analyze small beams, and involves a microscope objective lens to image the beam onto a detector. This technique expands the measurement range of the camera to include smaller beams, which could not be ordinarily measured due to the pixel size of the detector array. Near field profiling is performed in fiber and waveguide analysis, lens characterization, and other applications where beams 50 microns or smaller are analyzed.

  • Camera Near Field Profiler

    Near field profiling can also be used with camera profilers to analyze small beams, and involves a microscope objective lens to image the beam onto a camera detector array. This technique expands the measurement range of the camera to include smaller beams, which could not be ordinarily measured due to the pixel size of the detector array. Near field profiling is performed in fiber and waveguide analysis, lens characterization, and other applications where beams 50?m or smaller are analyzed.
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